Skip to main navigation Skip to search Skip to main content

Investigation of background electron emission in the LUX detector

  • D. S. Akerib
  • , S. Alsum
  • , H. M. Araújo
  • , X. Bai
  • , J. Balajthy
  • , A. Baxter
  • , E. P. Bernard
  • , A. Bernstein
  • , T. P. Biesiadzinski
  • , E. M. Boulton
  • , B. Boxer
  • , P. Brás
  • , S. Burdin
  • , D. Byram
  • , M. C. Carmona-Benitez
  • , C. Chan
  • , J. E. Cutter
  • , L. De Viveiros
  • , E. Druszkiewicz
  • , A. Fan
  • S. Fiorucci, R. J. Gaitskell, C. Ghag, M. G.D. Gilchriese, C. Gwilliam, C. R. Hall, S. J. Haselschwardt, S. A. Hertel, D. P. Hogan, M. Horn, D. Q. Huang, C. M. Ignarra, R. G. Jacobsen, O. Jahangir, W. Ji, K. Kamdin, K. Kazkaz, D. Khaitan, E. V. Korolkova, S. Kravitz, V. A. Kudryavtsev, E. Leason, B. G. Lenardo, K. T. Lesko, J. Liao, J. Lin, A. Lindote, M. I. Lopes, A. Manalaysay, R. L. Mannino, N. Marangou, D. N. McKinsey, D. M. Mei, M. Moongweluwan, J. A. Morad, A. St J. Murphy, A. Naylor, C. Nehrkorn, H. N. Nelson, F. Neves, A. Nilima, K. C. Oliver-Mallory, K. J. Palladino, E. K. Pease, Q. Riffard, G. R.C. Rischbieter, C. Rhyne, P. Rossiter, S. Shaw, T. A. Shutt, C. Silva, M. Solmaz, V. N. Solovov, P. Sorensen, T. J. Sumner, M. Szydagis, D. J. Taylor, R. Taylor, W. C. Taylor, B. P. Tennyson, P. A. Terman, D. R. Tiedt, W. H. To, L. Tvrznikova, U. Utku, S. Uvarov, A. Vacheret, V. Velan, R. C. Webb, J. T. White, T. J. Whitis, M. S. Witherell, F. L.H. Wolfs, D. Woodward, J. Xu, C. Zhang
  • SLAC National Accelerator Laboratory
  • Stanford University
  • University of Wisconsin-Madison
  • Imperial College London
  • South Dakota School of Mines & Technology
  • University of California at Davis
  • University of Liverpool
  • University of California at Berkeley
  • Lawrence Livermore National Laboratory
  • Lawrence Berkeley National Laboratory
  • Yale University
  • University of Coimbra
  • University of South Dakota
  • South Dakota Science and Technology Authority
  • Pennsylvania State University
  • Brown University
  • University of Rochester
  • University College London
  • University of Maryland, College Park
  • University of California at Santa Barbara
  • University of Massachusetts
  • University of Sheffield
  • University of Edinburgh
  • Texas A&M University
  • SUNY Albany
  • California State University Stanislaus

Research output: Contribution to journalArticlepeer-review

51 Scopus citations

Abstract

Dual-phase xenon detectors, as currently used in direct detection dark matter experiments, have observed elevated rates of background electron events in the low energy region. While this background negatively impacts detector performance in various ways, its origins have only been partially studied. In this paper we report a systematic investigation of the electron pathologies observed in the LUX dark matter experiment. We characterize different electron populations based on their emission intensities and their correlations with preceding energy depositions in the detector. By studying the background under different experimental conditions, we identified the leading emission mechanisms, including photoionization and the photoelectric effect induced by the xenon luminescence, delayed emission of electrons trapped under the liquid surface, capture and release of drifting electrons by impurities, and grid electron emission. We discuss how these backgrounds can be mitigated in LUX and future xenon-based dark matter experiments.

Original languageEnglish
Article number092004
JournalPhysical Review D
Volume102
Issue number9
DOIs
StatePublished - Nov 10 2020

Fingerprint

Dive into the research topics of 'Investigation of background electron emission in the LUX detector'. Together they form a unique fingerprint.

Cite this