Large strain deformation and cracking of nano-scale gold films on PDMS substrate

Onobu Akogwu; David Kwabi; Swaminadham Midturi; Marcus Eleruja; Babaniyi Babatope; W. O. Soboyejo

doi:10.1016/j.mseb.2010.02.023

Large strain deformation and cracking of nano-scale gold films on PDMS substrate

Onobu Akogwu
, David Kwabi
, Swaminadham Midturi
, Marcus Eleruja
, Babaniyi Babatope
, W. O. Soboyejo

President

SUNY Polytechnic Institute

Princeton University
University of Arkansas at Little Rock
Obafemi Awolowo University
Engineering Materials Development Institute

Research output: Contribution to journal › Article › peer-review

48 Scopus citations

Abstract

This paper presents the results of an experimental study of large strain tensile and cyclic damage in nano-scale gold (Au) thin films that were electron-beam deposited onto a 1mm thick polymeric substrate of poly-di-methyl-siloxane (PDMS). The effects of Au film thickness are examined for films with thicknesses of 50, 75 and 100 nm. Large strain deformation (up to 100%) is shown to give rise to grain boundary cracking that results in significant changes in film resistance under monotonic and cyclic loading. The implications of the results are discussed for development of flexible electronic structures.

Original language	English
Pages (from-to)	32-40
Number of pages	9
Journal	Materials Science and Engineering B: Solid-State Materials for Advanced Technology
Volume	170
Issue number	1-3
DOIs	https://doi.org/10.1016/j.mseb.2010.02.023
State	Published - Jun 15 2010

Keywords

Flexible electronics
Grain boundary cracking
Large strain deformation
Resistance changes
Tensile and cyclic damage

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10.1016/j.mseb.2010.02.023

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@article{ff77c5c6b95f4e2cb783c4262cdb4681,

title = "Large strain deformation and cracking of nano-scale gold films on PDMS substrate",

abstract = "This paper presents the results of an experimental study of large strain tensile and cyclic damage in nano-scale gold (Au) thin films that were electron-beam deposited onto a 1mm thick polymeric substrate of poly-di-methyl-siloxane (PDMS). The effects of Au film thickness are examined for films with thicknesses of 50, 75 and 100 nm. Large strain deformation (up to 100\%) is shown to give rise to grain boundary cracking that results in significant changes in film resistance under monotonic and cyclic loading. The implications of the results are discussed for development of flexible electronic structures.",

keywords = "Flexible electronics, Grain boundary cracking, Large strain deformation, Resistance changes, Tensile and cyclic damage",

author = "Onobu Akogwu and David Kwabi and Swaminadham Midturi and Marcus Eleruja and Babaniyi Babatope and Soboyejo, \{W. O.\}",

year = "2010",

month = jun,

day = "15",

doi = "10.1016/j.mseb.2010.02.023",

language = "English",

volume = "170",

pages = "32--40",

journal = "Materials Science and Engineering B: Solid-State Materials for Advanced Technology",

issn = "0921-5107",

number = "1-3",

}

TY - JOUR

T1 - Large strain deformation and cracking of nano-scale gold films on PDMS substrate

AU - Akogwu, Onobu

AU - Kwabi, David

AU - Midturi, Swaminadham

AU - Eleruja, Marcus

AU - Babatope, Babaniyi

AU - Soboyejo, W. O.

PY - 2010/6/15

Y1 - 2010/6/15

N2 - This paper presents the results of an experimental study of large strain tensile and cyclic damage in nano-scale gold (Au) thin films that were electron-beam deposited onto a 1mm thick polymeric substrate of poly-di-methyl-siloxane (PDMS). The effects of Au film thickness are examined for films with thicknesses of 50, 75 and 100 nm. Large strain deformation (up to 100%) is shown to give rise to grain boundary cracking that results in significant changes in film resistance under monotonic and cyclic loading. The implications of the results are discussed for development of flexible electronic structures.

AB - This paper presents the results of an experimental study of large strain tensile and cyclic damage in nano-scale gold (Au) thin films that were electron-beam deposited onto a 1mm thick polymeric substrate of poly-di-methyl-siloxane (PDMS). The effects of Au film thickness are examined for films with thicknesses of 50, 75 and 100 nm. Large strain deformation (up to 100%) is shown to give rise to grain boundary cracking that results in significant changes in film resistance under monotonic and cyclic loading. The implications of the results are discussed for development of flexible electronic structures.

KW - Flexible electronics

KW - Grain boundary cracking

KW - Large strain deformation

KW - Resistance changes

KW - Tensile and cyclic damage

UR - https://www.scopus.com/pages/publications/77953139738

U2 - 10.1016/j.mseb.2010.02.023

DO - 10.1016/j.mseb.2010.02.023

M3 - Article

SN - 0921-5107

VL - 170

SP - 32

EP - 40

JO - Materials Science and Engineering B: Solid-State Materials for Advanced Technology

JF - Materials Science and Engineering B: Solid-State Materials for Advanced Technology

IS - 1-3

ER -

Large strain deformation and cracking of nano-scale gold films on PDMS substrate

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Keywords

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