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Large strain-induced conductivity anisotropy in VO2 thin films probed by THz spectroscopy

  • Mengkun Liu
  • , Elsa Abreu
  • , Jiwei Lu
  • , Kevin G. West
  • , Salinporn Kittiwatanakul
  • , Wenjing Yin
  • , Stuart Wolf
  • , Richard D. Averitt
  • Boston University
  • University of Virginia

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

Abstract

We probe the temperature dependent far-infrared conductivity of highly strained (100)VO2 thin films using THz TDS. A large in-plane anisotropy is observed in both the metallic conductivity and the metal-insulator transition temperature.

Original languageEnglish
Title of host publicationQuantum Electronics and Laser Science Conference, QELS 2011
PublisherOptical Society of America (OSA)
ISBN (Print)9781557529107
DOIs
StatePublished - 2011
EventQuantum Electronics and Laser Science Conference, QELS 2011 - Baltimore, MD, United States
Duration: May 1 2011May 6 2011

Publication series

NameOptics InfoBase Conference Papers

Conference

ConferenceQuantum Electronics and Laser Science Conference, QELS 2011
Country/TerritoryUnited States
CityBaltimore, MD
Period05/1/1105/6/11

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