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LEARNING WITH INSTANCE-DEPENDENT NOISY LABELS BY ANCHOR HALLUCINATION AND HARD SAMPLE LABEL CORRECTION

  • Inventec Corporation

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

Abstract

Learning from noisy-labeled data is crucial for real-world applications. Traditional Noisy-Label Learning (NLL) methods categorize training data into clean and noisy sets based on the loss distribution of training samples. However, they often neglect that clean samples, especially those with intricate visual patterns, may also yield substantial losses. This oversight is particularly significant in datasets with Instance-Dependent Noise (IDN), where mislabeling probabilities correlate with visual appearance. Our approach explicitly distinguishes between clean vs. noisy and easy vs. hard samples. We identify training samples with small losses, assuming they have simple patterns and correct labels. Utilizing these easy samples, we hallucinate multiple anchors to select hard samples for label correction. Corrected hard samples, along with the easy samples, are used as labeled data in subsequent semi-supervised training. Experiments on synthetic and real-world IDN datasets demonstrate the superior performance of our method over other state-of-the-art NLL methods.

Original languageEnglish
Title of host publication2024 IEEE International Conference on Image Processing, ICIP 2024 - Proceedings
PublisherIEEE Computer Society
Pages901-907
Number of pages7
ISBN (Electronic)9798350349399
DOIs
StatePublished - 2024
Event31st IEEE International Conference on Image Processing, ICIP 2024 - Abu Dhabi, United Arab Emirates
Duration: Oct 27 2024Oct 30 2024

Publication series

NameProceedings - International Conference on Image Processing, ICIP

Conference

Conference31st IEEE International Conference on Image Processing, ICIP 2024
Country/TerritoryUnited Arab Emirates
CityAbu Dhabi
Period10/27/2410/30/24

Keywords

  • Noisy-label learning
  • anchor hallucination
  • instance-dependent noise
  • semi-supervised learning

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