Abstract
Cyclotron resonance lineshape distortions which include appreciable shifts in the peak position have been observed in far infrared laser transmission measurements of MOS structures. Experimental studies and a complete theoretical treatment show that these distortions arise from multiple interference effects in plane parallel sample substrates and from partial circular polarization of long wavelength coherent radiation owing to the light pipe optics.
| Original language | English |
|---|---|
| Pages (from-to) | 275-278 |
| Number of pages | 4 |
| Journal | Solid State Communications |
| Volume | 18 |
| Issue number | 3 |
| DOIs | |
| State | Published - 1976 |
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