TY - GEN
T1 - Local minima free parameterized appearance models
AU - Minh, Hoai Nguyen
AU - De La Torre, Fernando
PY - 2008
Y1 - 2008
N2 - Parameterized Appearance Models (PAMs) (e.g. Eigen-tracking, Active Appearance Models, Morphable Models) are commonly used to model the appearance and shape variation of objects in images. While PAMs have numerous advantages relative to alternate approaches, they have at least two drawbacks. First, they are especially prone to local minima in the fitting process. Second, often few if any of the local minima of the cost function correspond to acceptable solutions. To solve these problems, this paper proposes a method to learn a cost function by explicitly optimizing that the local minima occur at and only at the places corresponding to the correct fitting parameters. To the best of our knowledge, this is the first paper to address the problem of learning a cost function to explicitly model local properties of the error surface to fit PAMs. Synthetic and real examples show improvement in alignment performance in comparison with traditional approaches.
AB - Parameterized Appearance Models (PAMs) (e.g. Eigen-tracking, Active Appearance Models, Morphable Models) are commonly used to model the appearance and shape variation of objects in images. While PAMs have numerous advantages relative to alternate approaches, they have at least two drawbacks. First, they are especially prone to local minima in the fitting process. Second, often few if any of the local minima of the cost function correspond to acceptable solutions. To solve these problems, this paper proposes a method to learn a cost function by explicitly optimizing that the local minima occur at and only at the places corresponding to the correct fitting parameters. To the best of our knowledge, this is the first paper to address the problem of learning a cost function to explicitly model local properties of the error surface to fit PAMs. Synthetic and real examples show improvement in alignment performance in comparison with traditional approaches.
UR - https://www.scopus.com/pages/publications/51949099487
U2 - 10.1109/CVPR.2008.4587524
DO - 10.1109/CVPR.2008.4587524
M3 - Conference contribution
SN - 9781424422432
T3 - 26th IEEE Conference on Computer Vision and Pattern Recognition, CVPR
BT - 26th IEEE Conference on Computer Vision and Pattern Recognition, CVPR
T2 - 26th IEEE Conference on Computer Vision and Pattern Recognition, CVPR
Y2 - 23 June 2008 through 28 June 2008
ER -