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Machine Learning to Predict the L-Point Direct Bandgap of Bi1-xSbx Nanomaterials

  • Shuang Tang
  • , Jenna Jean-Baptiste
  • , Schuyler Vecchiano
  • , Adam Lukasiewicz
  • , Alexandria Burger
  • SUNY Polytechnic Institute

Research output: Contribution to journalArticlepeer-review

3 Scopus citations

Abstract

With the development of modern nanoscience and nanotechnology, Bi1-xSbx can be synthesized into different nanoscale and nanostructured forms, including thin films, nanowires, nanotubes, nanoribbons, and many others. However, due to the strong correlation between electrons and holes at the L-point in the Brillouin zone, the direct band evolves in an anomalous manner under the quantum confinement when nanostructured. Due to the alloying and the low symmetry, predicting the L-point direct bandgap in a nanomaterial using either ab initio calculations or k·p perturbations can be computationally costive or inaccurate. We here try to solve this problem using the machine learning methods, including the support vector regression, the regression tree, the Gaussian process regression, and the artificial neural network. A goodness-of-fit of ~0.99 can be achieved for Bi1-xSbx thin films and nanowires.

Original languageEnglish
Pages (from-to)236-242
Number of pages7
JournalEngineered Science
Volume19
DOIs
StatePublished - Sep 2022

Keywords

  • Bagged tree
  • Bandgap
  • BiSbNanomaterials
  • Gaussian process Artificial neural network
  • Machine learning
  • Support vector Regression

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