Abstract
Combining X-ray magnetic circular dichroism (X-MCD) with a transmission X-ray microscope (TXM) allows to image element-specifically magnetic domain structures with 25nm lateral resolution. Both in-plane and out-of-plane systems can be studied in applied magnetic fields. Thus field-dependent parameters, as individual nucleation fields in magnetic nanostructures can be deduced and related to morphology. Images of thermomagnetically written bits in magneto-optical TbFeCo media proof the reliability of the writing process and the importance of an exact thermal design of the systems. Domains observed at corresponding Co L edges proof the chemical sensitivity of M-TXM and its potential to image few monolayer systems.
| Original language | English |
|---|---|
| Pages (from-to) | 325-327 |
| Number of pages | 3 |
| Journal | Journal of Synchrotron Radiation |
| Volume | 8 |
| Issue number | 2 |
| DOIs | |
| State | Published - Mar 1 2001 |
Keywords
- Magnetic domains
- X-ray magnetic circular dichroism
- X-ray microscopy
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