Skip to main navigation Skip to search Skip to main content

Measurements of Inclusive [Formula presented] Production

  • S. Anderson
  • , V. V. Frolov
  • , Y. Kubota
  • , S. J. Lee
  • , S. Z. Li
  • , R. Poling
  • , A. Smith
  • , C. J. Stepaniak
  • , J. Urheim
  • , Z. Metreveli
  • , K. K. Seth
  • , A. Tomaradze
  • , P. Zweber
  • , S. Ahmed
  • , M. S. Alam
  • , L. Jian
  • , M. Saleem
  • , F. Wappler
  • , E. Eckhart
  • , K. K. Gan
  • C. Gwon, T. Hart, K. Honscheid, D. Hufnagel, H. Kagan, R. Kass, T. K. Pedlar, J. B. Thayer, E. von Toerne, T. Wilksen, M. M. Zoeller, H. Muramatsu, S. J. Richichi, H. Severini, P. Skubic, S. A. Dytman, J. A. Mueller, S. Nam, V. Savinov, S. Chen, J. W. Hinson, J. Lee, D. H. Miller, V. Pavlunin, E. I. Shibata, I. P.J. Shipsey, D. Cronin-Hennessy, A. L. Lyon, C. S. Park, W. Park, E. H. Thorndike, T. E. Coan, Y. S. Gao, F. Liu, Y. Maravin, I. Narsky, R. Stroynowski, M. Artuso, C. Boulahouache, K. Bukin, E. Dambasuren, K. Khroustalev, G. C. Moneti, R. Mountain, R. Nandakumar, T. Skwarnicki, S. Stone, J. C. Wang, A. H. Mahmood, S. E. Csorna, I. Danko, Z. Xu, G. Bonvicini, D. Cinabro, M. Dubrovin, S. McGee, A. Bornheim, E. Lipeles, S. P. Pappas, A. Shapiro, W. M. Sun, A. J. Weinstein, G. Masek, H. P. Paar, R. Mahapatra, H. N. Nelson, R. A. Briere, G. P. Chen, T. Ferguson, G. Tatishvili, H. Vogel, N. E. Adam, J. P. Alexander, K. Berkelman, F. Blanc, V. Boisvert, D. G. Cassel, P. S. Drell, J. E. Duboscq, K. M. Ecklund, R. Ehrlich, L. Gibbons, B. Gittelman, S. W. Gray, D. L. Hartill, B. K. Heltsley, L. Hsu, C. D. Jones, J. Kandaswamy, D. L. Kreinick, A. Magerkurth, H. Mahlke-Krüger, T. O. Meyer, N. B. Mistry, E. Nordberg, J. R. Patterson, D. Peterson, J. Pivarski, D. Riley, A. J. Sadoff, H. Schwarthoff, M. R. Shepherd, J. G. Thayer, D. Urner, B. Valant-Spaight, G. Viehhauser, A. Warburton, M. Weinberger, S. B. Athar, P. Avery, L. Breva-Newell, V. Potlia, H. Stoeck, J. Yelton, G. Brandenburg, A. Ershov, D. Y.J. Kim, R. Wilson, K. Benslama, B. I. Eisenstein, J. Ernst, G. D. Gollin, R. M. Hans, I. Karliner, N. Lowrey, M. A. Marsh, C. Plager, C. Sedlack, M. Selen, J. J. Thaler, J. Williams, K. W. Edwards, R. Ammar, D. Besson, X. Zhao
  • University of Minnesota Twin Cities
  • Northwestern University
  • SUNY Albany
  • Ohio State University
  • University of Oklahoma
  • University of Pittsburgh
  • Purdue University
  • University of Rochester
  • Southern Methodist University
  • Syracuse University
  • University of Texas-Pan American
  • Vanderbilt University
  • Wayne State University
  • California Institute of Technology
  • University of California at San Diego
  • University of California at Santa Barbara
  • Carnegie Mellon University
  • Cornell University
  • University of Florida
  • Harvard University
  • University of Illinois at Urbana-Champaign
  • Carleton University
  • University of Kansas

Research output: Contribution to journalArticlepeer-review

Abstract

Using the combined CLEO II and CLEO II.V data sets of [Formula presented] at the [Formula presented], we measure properties of [Formula presented] mesons produced directly from decays of the [Formula presented] meson, where “[Formula presented]” denotes an admixture of [Formula presented], [Formula presented], [Formula presented], and [Formula presented], and “[Formula presented]” denotes either [Formula presented] or [Formula presented]. We report first measurements of [Formula presented] polarization in [Formula presented]: [Formula presented] and [Formula presented]. We also report improved measurements of the momentum distributions of [Formula presented] produced directly from [Formula presented] decays, correcting for measurement smearing. Finally, we report measurements of the inclusive branching fraction for [Formula presented] and [Formula presented].

Original languageEnglish
JournalPhysical Review Letters
Volume89
Issue number28
DOIs
StatePublished - 2002

Fingerprint

Dive into the research topics of 'Measurements of Inclusive [Formula presented] Production'. Together they form a unique fingerprint.

Cite this