Abstract
We have studied high-energy shifts of single quantum dot (QD) emission lines induced by contact pressure exerted by a near-field optical fiber tip. "Pressure" coefficients of 0.65-3 meV/nm have been measured for self-organized InAs/GaAs, InAs/AlAs and InP/GalnP QDs in agreement with numerical calculations of the local strain field. We found an increase of the tip-induced pressure with increasing aperture diameter from 50-300 nm. A correlation between the shift rate and QD stiffness was obtained. We also observed an increase (x 10) of QD emission intensity with increased pressure.
| Original language | English |
|---|---|
| Pages (from-to) | 137-140 |
| Number of pages | 4 |
| Journal | Institute of Physics Conference Series |
| Volume | 174 |
| State | Published - 2003 |
| Event | Compound Semiconductors 2002 - Proceedings of the Twenty-Ninth International Symposium on Compound Semiconductors - Lausanne, Switzerland Duration: Oct 7 2002 → Oct 10 2002 |
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