Abstract
Microcrystalline thin Si films were grown by the metal-induced growth method. The metal catalyst (Co, Ni, or Co-coated Ni) first reacted to sputtered Si forming a silicide layer. Then a Si film was epitaxially grown above the silicide seed template. The crystallinity of Si films was investigated by X-ray diffraction (XRD) confirming Si film growth with CoSi2 or NiSi2 as an intermediate step. The grown Si films were fabricated into Schottky photodiodes. The Co-coated Ni modulated the silicide formation and gave a short-circuit current density (Jsc) of 10.6 mA/cm2, which is one order higher than that for the single Co catalyst case.
| Original language | English |
|---|---|
| Pages (from-to) | 534-538 |
| Number of pages | 5 |
| Journal | Solar Energy Materials and Solar Cells |
| Volume | 91 |
| Issue number | 6 |
| DOIs | |
| State | Published - Mar 23 2007 |
Keywords
- Epitaxial crystalline
- Metal silicide
- Photovoltaics
- Si film
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