Microwave surface resistance of YBa2Cu3Cu3O7-x films on polycrystalline ceramic substrates with textured buffer layers

A. T. Findikoglu; S. R. Foltyn; P. N. Arendt; J. R. Groves; Q. X. Jia; E. J. Peterson; X. D. Wu; D. W. Reagor

doi:10.1063/1.117052

Microwave surface resistance of YBa₂Cu₃Cu₃O_7-x films on polycrystalline ceramic substrates with textured buffer layers

A. T. Findikoglu
, S. R. Foltyn
, P. N. Arendt
, J. R. Groves
, Q. X. Jia
, E. J. Peterson
, X. D. Wu
, D. W. Reagor

Department of Materials Design and Innovation

University at Buffalo

Research output: Contribution to journal › Article › peer-review

9 Scopus citations

Abstract

We have used a parallel-plate resonator technique to measure the microwave surface resistance R_s of YBa₂Cu₃O_7-x (YBCO) films on buffered ceramic substrates at around 10 GHz, and studied the correlation between their R_s and materials properties. A 0.4-μm-thick YBCO film (with an in-plane mosaic spread of 7°) grown on a polycrystalline alumina substrate with an ion-beam-assisted-deposited yttria-stabilized zirconia buffer layer showed an R_s of 1.89 mΩ at 76 K and 0.21 mΩ at 4 K. We have observed a strong correlation between the R_s of the samples and the in-plane mosaic spread of the YBCO films. This correlation can be explained qualitatively in terms of a simple model in which the weak links between the grains of the YBCO film form an electrical network of Josephson junctions.

Original language	English
Pages (from-to)	1626-1628
Number of pages	3
Journal	Applied Physics Letters
Volume	69
Issue number	11
DOIs	https://doi.org/10.1063/1.117052
State	Published - Sep 9 1996

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@article{d20ee001742b43b2b678fcad44becd88,

title = "Microwave surface resistance of YBa2Cu3Cu3O7-x films on polycrystalline ceramic substrates with textured buffer layers",

abstract = "We have used a parallel-plate resonator technique to measure the microwave surface resistance Rs of YBa2Cu3O7-x (YBCO) films on buffered ceramic substrates at around 10 GHz, and studied the correlation between their Rs and materials properties. A 0.4-μm-thick YBCO film (with an in-plane mosaic spread of 7°) grown on a polycrystalline alumina substrate with an ion-beam-assisted-deposited yttria-stabilized zirconia buffer layer showed an Rs of 1.89 mΩ at 76 K and 0.21 mΩ at 4 K. We have observed a strong correlation between the Rs of the samples and the in-plane mosaic spread of the YBCO films. This correlation can be explained qualitatively in terms of a simple model in which the weak links between the grains of the YBCO film form an electrical network of Josephson junctions.",

author = "Findikoglu, \{A. T.\} and Foltyn, \{S. R.\} and Arendt, \{P. N.\} and Groves, \{J. R.\} and Jia, \{Q. X.\} and Peterson, \{E. J.\} and Wu, \{X. D.\} and Reagor, \{D. W.\}",

year = "1996",

month = sep,

day = "9",

doi = "10.1063/1.117052",

language = "English",

volume = "69",

pages = "1626--1628",

journal = "Applied Physics Letters",

issn = "0003-6951",

publisher = "American Institute of Physics",

number = "11",

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TY - JOUR

T1 - Microwave surface resistance of YBa2Cu3Cu3O7-x films on polycrystalline ceramic substrates with textured buffer layers

AU - Findikoglu, A. T.

AU - Foltyn, S. R.

AU - Arendt, P. N.

AU - Groves, J. R.

AU - Jia, Q. X.

AU - Peterson, E. J.

AU - Wu, X. D.

AU - Reagor, D. W.

PY - 1996/9/9

Y1 - 1996/9/9

N2 - We have used a parallel-plate resonator technique to measure the microwave surface resistance Rs of YBa2Cu3O7-x (YBCO) films on buffered ceramic substrates at around 10 GHz, and studied the correlation between their Rs and materials properties. A 0.4-μm-thick YBCO film (with an in-plane mosaic spread of 7°) grown on a polycrystalline alumina substrate with an ion-beam-assisted-deposited yttria-stabilized zirconia buffer layer showed an Rs of 1.89 mΩ at 76 K and 0.21 mΩ at 4 K. We have observed a strong correlation between the Rs of the samples and the in-plane mosaic spread of the YBCO films. This correlation can be explained qualitatively in terms of a simple model in which the weak links between the grains of the YBCO film form an electrical network of Josephson junctions.

AB - We have used a parallel-plate resonator technique to measure the microwave surface resistance Rs of YBa2Cu3O7-x (YBCO) films on buffered ceramic substrates at around 10 GHz, and studied the correlation between their Rs and materials properties. A 0.4-μm-thick YBCO film (with an in-plane mosaic spread of 7°) grown on a polycrystalline alumina substrate with an ion-beam-assisted-deposited yttria-stabilized zirconia buffer layer showed an Rs of 1.89 mΩ at 76 K and 0.21 mΩ at 4 K. We have observed a strong correlation between the Rs of the samples and the in-plane mosaic spread of the YBCO films. This correlation can be explained qualitatively in terms of a simple model in which the weak links between the grains of the YBCO film form an electrical network of Josephson junctions.

UR - https://www.scopus.com/pages/publications/0030576832

U2 - 10.1063/1.117052

DO - 10.1063/1.117052

M3 - Article

SN - 0003-6951

VL - 69

SP - 1626

EP - 1628

JO - Applied Physics Letters

JF - Applied Physics Letters

IS - 11

ER -

Microwave surface resistance of YBa₂Cu₃Cu₃O_7-x films on polycrystalline ceramic substrates with textured buffer layers

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