Abstract
Non-contact atomic force microscopy (NC-AFM) was used to study thin films of C60 on Au(111). After observing the Au(111) 23 × √3 reconstruction, 2-3 monolayers of C60 were deposited onto the Au surface. The close-packed C60 surface was imaged by NC-AFM with molecular resolution. Enhanced corrugation and a stretching of the C60 lattice were observed at step edges. Based on a calculation of the force required to displace an edge molecule, it is proposed that the edge effects are a result of tip-induced displacements of edge molecules. While imaging small clusters of C60, some molecules were removed, leading to structural rearrangements of the clusters.
| Original language | English |
|---|---|
| Pages (from-to) | S40-S43 |
| Journal | Nanotechnology |
| Volume | 15 |
| Issue number | 2 |
| DOIs | |
| State | Published - Feb 2004 |
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