Multitechnique spectroscopic analysis of polymer surfaces

The analysis of polymeric materials by modern surface sensitive spectroscopic experiments has yielded results which can be useful in solving both fundamental structural questions and problems which arise with the use of working materials. This paper will review the developments in polymer surface analysis which utilize the techniques of X-ray photoelectron spectroscopy (XPS or ESCA), secondary ion mass spectrometry (SIMS), ion scattering spectrometry (ISS), and fourier transform IR (FT-IR) spectroscopy stressing the complementary nature of the information derived from these methods.