New demonstration technique of 20 nm spatial resolution soft X-ray microscopy

W. Chao; E. Anderson; G. Denbeaux; B. Harteneck; J. A. Liddle; D. Olynick; A. L. Pearson; F. Salmassi; C. Song; D. Attwood

New demonstration technique of 20 nm spatial resolution soft X-ray microscopy

W. Chao
, E. Anderson
, G. Denbeaux
, B. Harteneck
, J. A. Liddle
, D. Olynick
, A. L. Pearson
, F. Salmassi
, C. Song
, D. Attwood

Nanoscale Science and Engineering

University at Albany

Research output: Contribution to journal › Conference article › peer-review

Abstract

The full-field transmission soft X-ray microscope XM-1, located at LNBL's Advanced Light Source (ALS), is a versatile imaging tool. It provides a unique combination of capabilities. The microscope has been successfully applied to studies of wet biological samples, environmental sciences, nanomagnetic studies, and electromigration studies.

Original language	English
Pages (from-to)	225-226
Number of pages	2
Journal	Conference Proceedings - Lasers and Electro-Optics Society Annual Meeting-LEOS
Volume	1
State	Published - 2003
Event	2003 IEEE LEOS Annual Meeting Conference Proceedings - TUCSON, AZ, United States Duration: Oct 26 2003 → Oct 30 2003

Cite this

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title = "New demonstration technique of 20 nm spatial resolution soft X-ray microscopy",

abstract = "The full-field transmission soft X-ray microscope XM-1, located at LNBL's Advanced Light Source (ALS), is a versatile imaging tool. It provides a unique combination of capabilities. The microscope has been successfully applied to studies of wet biological samples, environmental sciences, nanomagnetic studies, and electromigration studies.",

author = "W. Chao and E. Anderson and G. Denbeaux and B. Harteneck and Liddle, \{J. A.\} and D. Olynick and Pearson, \{A. L.\} and F. Salmassi and C. Song and D. Attwood",

year = "2003",

language = "English",

volume = "1",

pages = "225--226",

journal = "Conference Proceedings - Lasers and Electro-Optics Society Annual Meeting-LEOS",

issn = "1092-8081",

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note = "2003 IEEE LEOS Annual Meeting Conference Proceedings ; Conference date: 26-10-2003 Through 30-10-2003",

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T1 - New demonstration technique of 20 nm spatial resolution soft X-ray microscopy

AU - Chao, W.

AU - Anderson, E.

AU - Denbeaux, G.

AU - Harteneck, B.

AU - Liddle, J. A.

AU - Olynick, D.

AU - Pearson, A. L.

AU - Salmassi, F.

AU - Song, C.

AU - Attwood, D.

PY - 2003

Y1 - 2003

N2 - The full-field transmission soft X-ray microscope XM-1, located at LNBL's Advanced Light Source (ALS), is a versatile imaging tool. It provides a unique combination of capabilities. The microscope has been successfully applied to studies of wet biological samples, environmental sciences, nanomagnetic studies, and electromigration studies.

AB - The full-field transmission soft X-ray microscope XM-1, located at LNBL's Advanced Light Source (ALS), is a versatile imaging tool. It provides a unique combination of capabilities. The microscope has been successfully applied to studies of wet biological samples, environmental sciences, nanomagnetic studies, and electromigration studies.

UR - https://www.scopus.com/pages/publications/0345328141

M3 - Conference article

SN - 1092-8081

VL - 1

SP - 225

EP - 226

JO - Conference Proceedings - Lasers and Electro-Optics Society Annual Meeting-LEOS

JF - Conference Proceedings - Lasers and Electro-Optics Society Annual Meeting-LEOS

T2 - 2003 IEEE LEOS Annual Meeting Conference Proceedings

Y2 - 26 October 2003 through 30 October 2003

ER -

New demonstration technique of 20 nm spatial resolution soft X-ray microscopy

Abstract

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