Abstract
The effect of surface roughness on the static layer undulations of multilayer films of a side-chain liquid-crystalline polymer has been investigated by off-specular x-ray scattering. The roughness correlation length evaluated from the off-specular data is shown to vary inversely with the average roughness of the multilayer film. The features of the off-specular x-ray scattering are similar to those exhibited by inorganic heterostructural films.
| Original language | English |
|---|---|
| Pages (from-to) | 671-680 |
| Number of pages | 10 |
| Journal | Physical Review E |
| Volume | 52 |
| Issue number | 1 |
| DOIs | |
| State | Published - 1995 |
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