TY - GEN
T1 - Optimal statistical chip disposition
AU - Zolotov, Vladimir
AU - Xiong, Jinjun
PY - 2011
Y1 - 2011
N2 - A chip disposition criterion is used to decide whether to accept or discard a chip during chip testing. Its quality directly impacts both yield and product quality loss (PQL). The importance becomes even more significant with the increasingly large process variation. For the first time, this paper rigorously formulates the optimal chip disposition problem, and proposes an elegant solution. We show that the optimal chip disposition criterion is different from the existing industry practice. Our solution can find the optimal disposition criterion efficiently with better yield under the same PQL constraint, or lower PQL under the same yield constraint.
AB - A chip disposition criterion is used to decide whether to accept or discard a chip during chip testing. Its quality directly impacts both yield and product quality loss (PQL). The importance becomes even more significant with the increasingly large process variation. For the first time, this paper rigorously formulates the optimal chip disposition problem, and proposes an elegant solution. We show that the optimal chip disposition criterion is different from the existing industry practice. Our solution can find the optimal disposition criterion efficiently with better yield under the same PQL constraint, or lower PQL under the same yield constraint.
UR - https://www.scopus.com/pages/publications/84855790497
U2 - 10.1109/ICCAD.2011.6105312
DO - 10.1109/ICCAD.2011.6105312
M3 - Conference contribution
SN - 9781457713989
T3 - IEEE/ACM International Conference on Computer-Aided Design, Digest of Technical Papers, ICCAD
SP - 95
EP - 102
BT - 2011 IEEE/ACM International Conference on Computer-Aided Design, ICCAD 2011
T2 - 2011 IEEE/ACM International Conference on Computer-Aided Design, ICCAD 2011
Y2 - 7 November 2011 through 10 November 2011
ER -