ORIGIN OF GRAIN CONTRAST IN THE SCANNING ACOUSTIC MICROSCOPE.

M. G. Soumekh; G. A.D. Briggs; C. Ilett

doi:10.1007/978-1-4613-2779-0_10

ORIGIN OF GRAIN CONTRAST IN THE SCANNING ACOUSTIC MICROSCOPE.

M. G. Soumekh
, G. A.D. Briggs
, C. Ilett

Department of Electrical Engineering

University at Buffalo

University of Oxford

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review

Abstract

The contrast in the scanning acoustic microscope may be described by the output response V(z) curve. The potential of the SAM lies in the fact that the V(z) curve is a strong function of the elastic properties of the material. It is thus possible to image elastic properties with spatial resolution of the order of a micron or better provided the incident radiation has a sufficiently small wavelength. In this paper the formulation of Fourier Optics is applied to anisotropic specimens and the full V(z) curve is predicted from the independent elastic constants. The presence of two propagating surface waves is inferred from the calculated reflectance functions. Finally the Fourier Optics approach is employed to explain the contrast from grains of different orientations.

Original language	English
Title of host publication	Acoustical Imaging
Subtitle of host publication	Proceedings of the International Symposium
Publisher	Plenum Press
Pages	107-118
Number of pages	12
ISBN (Print)	0306417170, 9780306417177
DOIs	https://doi.org/10.1007/978-1-4613-2779-0_10
State	Published - 1984

Publication series

Name	Acoustical Imaging: Proceedings of the International Symposium
Volume	13

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10.1007/978-1-4613-2779-0_10

Cite this

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title = "ORIGIN OF GRAIN CONTRAST IN THE SCANNING ACOUSTIC MICROSCOPE.",

abstract = "The contrast in the scanning acoustic microscope may be described by the output response V(z) curve. The potential of the SAM lies in the fact that the V(z) curve is a strong function of the elastic properties of the material. It is thus possible to image elastic properties with spatial resolution of the order of a micron or better provided the incident radiation has a sufficiently small wavelength. In this paper the formulation of Fourier Optics is applied to anisotropic specimens and the full V(z) curve is predicted from the independent elastic constants. The presence of two propagating surface waves is inferred from the calculated reflectance functions. Finally the Fourier Optics approach is employed to explain the contrast from grains of different orientations.",

author = "Soumekh, \{M. G.\} and Briggs, \{G. A.D.\} and C. Ilett",

year = "1984",

doi = "10.1007/978-1-4613-2779-0\_10",

language = "English",

isbn = "0306417170",

series = "Acoustical Imaging: Proceedings of the International Symposium",

publisher = "Plenum Press",

pages = "107--118",

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ORIGIN OF GRAIN CONTRAST IN THE SCANNING ACOUSTIC MICROSCOPE. / Soumekh, M. G.; Briggs, G. A.D.; Ilett, C.
Acoustical Imaging: Proceedings of the International Symposium. Plenum Press, 1984. p. 107-118 (Acoustical Imaging: Proceedings of the International Symposium; Vol. 13).

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review

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AU - Briggs, G. A.D.

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Y1 - 1984

N2 - The contrast in the scanning acoustic microscope may be described by the output response V(z) curve. The potential of the SAM lies in the fact that the V(z) curve is a strong function of the elastic properties of the material. It is thus possible to image elastic properties with spatial resolution of the order of a micron or better provided the incident radiation has a sufficiently small wavelength. In this paper the formulation of Fourier Optics is applied to anisotropic specimens and the full V(z) curve is predicted from the independent elastic constants. The presence of two propagating surface waves is inferred from the calculated reflectance functions. Finally the Fourier Optics approach is employed to explain the contrast from grains of different orientations.

AB - The contrast in the scanning acoustic microscope may be described by the output response V(z) curve. The potential of the SAM lies in the fact that the V(z) curve is a strong function of the elastic properties of the material. It is thus possible to image elastic properties with spatial resolution of the order of a micron or better provided the incident radiation has a sufficiently small wavelength. In this paper the formulation of Fourier Optics is applied to anisotropic specimens and the full V(z) curve is predicted from the independent elastic constants. The presence of two propagating surface waves is inferred from the calculated reflectance functions. Finally the Fourier Optics approach is employed to explain the contrast from grains of different orientations.

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SN - 9780306417177

T3 - Acoustical Imaging: Proceedings of the International Symposium

SP - 107

EP - 118

BT - Acoustical Imaging

PB - Plenum Press

ER -

ORIGIN OF GRAIN CONTRAST IN THE SCANNING ACOUSTIC MICROSCOPE.

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