TY - GEN
T1 - Package Design Through Reliable Predictive Modeling and Its Validation
AU - Yin, Pengcheng
AU - Park, Seungbae
AU - Jacob, Biju
AU - Yin, Liang
AU - Gowda, Arun
N1 - Publisher Copyright: © 2022 IEEE.
PY - 2022
Y1 - 2022
N2 - The outer packing of electronic products plays a significant role in keeping inner electronics' functionality. The different designs and materials of outer packing would decrease or isolate the impact energy that further damage the interconnection or chip (such as solder-joint failure, chip-cracking, and pad cratering), which could let the product survive in some extreme working conditions. A specific outer packing was designed for the special inner electronics which need to survive at high-speed impact, 30 mph, and the outer packing should also be moisture resistant. The simulation software, ANSYS/LS-DYNA, was used in this work. Two configurations of outer packing were investigated, one is sphere structure, another is hockey puck structure. Several other parameters were also investigated, like the single layer vs double layer (soft outside hard/stiff inside vs hard/stiff outside soft outside), pimple design (plain vs inner pinball vs extruded pinball), and material of outer packing. For the material of outer packing, foam material, as a well-known shock-absorbing material, was selected for this work. Due to the moisture resistance requirement, there are several closed-cell foams were selected, such as ethylene propylene diene monomer (EPDM), polyethylene, polyvinyl chloride (PVC), polychloroprene (Neoprene_1(smaller density), and Neoprene_2(larger density)). The compression experiments and simulations were performed for each selected foam to validate the finite element model of each foam. And because the strain rate of foam material always changes during the entire impact event, the predicted simulations were performed to obtain the correct material property of foam by using the validated FE foam model. The final design was decided by the predicted material properties of each foam.
AB - The outer packing of electronic products plays a significant role in keeping inner electronics' functionality. The different designs and materials of outer packing would decrease or isolate the impact energy that further damage the interconnection or chip (such as solder-joint failure, chip-cracking, and pad cratering), which could let the product survive in some extreme working conditions. A specific outer packing was designed for the special inner electronics which need to survive at high-speed impact, 30 mph, and the outer packing should also be moisture resistant. The simulation software, ANSYS/LS-DYNA, was used in this work. Two configurations of outer packing were investigated, one is sphere structure, another is hockey puck structure. Several other parameters were also investigated, like the single layer vs double layer (soft outside hard/stiff inside vs hard/stiff outside soft outside), pimple design (plain vs inner pinball vs extruded pinball), and material of outer packing. For the material of outer packing, foam material, as a well-known shock-absorbing material, was selected for this work. Due to the moisture resistance requirement, there are several closed-cell foams were selected, such as ethylene propylene diene monomer (EPDM), polyethylene, polyvinyl chloride (PVC), polychloroprene (Neoprene_1(smaller density), and Neoprene_2(larger density)). The compression experiments and simulations were performed for each selected foam to validate the finite element model of each foam. And because the strain rate of foam material always changes during the entire impact event, the predicted simulations were performed to obtain the correct material property of foam by using the validated FE foam model. The final design was decided by the predicted material properties of each foam.
KW - foam outer packing design
KW - high-speed drop impact
KW - moisture resistance
UR - https://www.scopus.com/pages/publications/85134662429
U2 - 10.1109/ECTC51906.2022.00273
DO - 10.1109/ECTC51906.2022.00273
M3 - Conference contribution
T3 - Proceedings - Electronic Components and Technology Conference
SP - 1738
EP - 1744
BT - Proceedings - IEEE 72nd Electronic Components and Technology Conference, ECTC 2022
PB - Institute of Electrical and Electronics Engineers Inc.
T2 - 72nd IEEE Electronic Components and Technology Conference, ECTC 2022
Y2 - 31 May 2022 through 3 June 2022
ER -