Part B: Imaging dielectric properties of Si nanowire oxide with conductive atomic force microscopy complemented with femtosecond laser illumination

E. Stratakis; N. Misra; E. Spanakis; D. Hwang; C. Grigoropoulos; C. Fotakis; P. Tzanetakis

doi:10.2351/1.5061419

Part B: Imaging dielectric properties of Si nanowire oxide with conductive atomic force microscopy complemented with femtosecond laser illumination

E. Stratakis
, N. Misra
, E. Spanakis
, D. Hwang
, C. Grigoropoulos
, C. Fotakis
, P. Tzanetakis

Mechanical Engineering

Stony Brook University

Research output: Contribution to conference › Paper › peer-review

Original language	English
Pages	88-92
Number of pages	5
DOIs	https://doi.org/10.2351/1.5061419
State	Published - 2008
Event	ICALEO 2008 - 27th International Congress on Applications of Lasers and Electro-Optics - Temecula, CA, United States Duration: Oct 20 2008 → Oct 23 2008

Conference

Conference	ICALEO 2008 - 27th International Congress on Applications of Lasers and Electro-Optics
Country/Territory	United States
City	Temecula, CA
Period	10/20/08 → 10/23/08

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10.2351/1.5061419

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Stratakis, E., Misra, N., Spanakis, E., Hwang, D., Grigoropoulos, C., Fotakis, C., & Tzanetakis, P. (2008). Part B: Imaging dielectric properties of Si nanowire oxide with conductive atomic force microscopy complemented with femtosecond laser illumination. 88-92. Paper presented at ICALEO 2008 - 27th International Congress on Applications of Lasers and Electro-Optics, Temecula, CA, United States. https://doi.org/10.2351/1.5061419

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title = "Part B: Imaging dielectric properties of Si nanowire oxide with conductive atomic force microscopy complemented with femtosecond laser illumination",

author = "E. Stratakis and N. Misra and E. Spanakis and D. Hwang and C. Grigoropoulos and C. Fotakis and P. Tzanetakis",

year = "2008",

doi = "10.2351/1.5061419",

language = "English",

pages = "88--92",

note = "ICALEO 2008 - 27th International Congress on Applications of Lasers and Electro-Optics ; Conference date: 20-10-2008 Through 23-10-2008",

}

Stratakis, E, Misra, N, Spanakis, E, Hwang, D, Grigoropoulos, C, Fotakis, C & Tzanetakis, P 2008, 'Part B: Imaging dielectric properties of Si nanowire oxide with conductive atomic force microscopy complemented with femtosecond laser illumination', Paper presented at ICALEO 2008 - 27th International Congress on Applications of Lasers and Electro-Optics, Temecula, CA, United States, 10/20/08 - 10/23/08 pp. 88-92. https://doi.org/10.2351/1.5061419

Part B: Imaging dielectric properties of Si nanowire oxide with conductive atomic force microscopy complemented with femtosecond laser illumination. / Stratakis, E.; Misra, N.; Spanakis, E. et al.
2008. 88-92 Paper presented at ICALEO 2008 - 27th International Congress on Applications of Lasers and Electro-Optics, Temecula, CA, United States.

Research output: Contribution to conference › Paper › peer-review

TY - CONF

T1 - Part B

T2 - ICALEO 2008 - 27th International Congress on Applications of Lasers and Electro-Optics

AU - Stratakis, E.

AU - Misra, N.

AU - Spanakis, E.

AU - Hwang, D.

AU - Grigoropoulos, C.

AU - Fotakis, C.

AU - Tzanetakis, P.

PY - 2008

Y1 - 2008

UR - https://www.scopus.com/pages/publications/75149161897

U2 - 10.2351/1.5061419

DO - 10.2351/1.5061419

M3 - Paper

SP - 88

EP - 92

Y2 - 20 October 2008 through 23 October 2008

ER -

Stratakis E, Misra N, Spanakis E, Hwang D, Grigoropoulos C, Fotakis C et al.. Part B: Imaging dielectric properties of Si nanowire oxide with conductive atomic force microscopy complemented with femtosecond laser illumination. 2008. Paper presented at ICALEO 2008 - 27th International Congress on Applications of Lasers and Electro-Optics, Temecula, CA, United States. doi: 10.2351/1.5061419

Part B: Imaging dielectric properties of Si nanowire oxide with conductive atomic force microscopy complemented with femtosecond laser illumination

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