Abstract
The time dependences of the photoluminescence intensity is studied for InGaAsSb/AlGaAsSb quantum wells with different barrier widths and different barrier-material compositions. From analysis of the photoluminescence dynamics, the times of charge-carrier trapping at quantum wells, the energy dissipation times, and the lifetimes, including the lifetime with respect to resonant Auger recombination, are determined. It is shown that, for a certain structure configuration, it is possible to observe the resonant Auger recombination of nonequilibrium charge carriers.
| Original language | English |
|---|---|
| Pages (from-to) | 146-151 |
| Number of pages | 6 |
| Journal | Semiconductors |
| Volume | 47 |
| Issue number | 1 |
| DOIs | |
| State | Published - 2013 |
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