Abstract
The use of interference narrowing of Stark resonances for three-dimensional mapping of electric fields to an unprecedented level of precision is described. A method for calibration of electric fields to an accuracy currently limited only by theory is proposed. Measurements that were repeatable and reliable to a precision of 10 ppm have been obtained. The accuracy of the method is limited by atomic constants rather than by the measurements of spacers and voltages, and it is at least 100 times better than the present standard for field calibration.
| Original language | English |
|---|---|
| Pages (from-to) | 170-171 |
| Number of pages | 2 |
| Journal | CPEM Digest (Conference on Precision Electromagnetic Measurements) |
| State | Published - Jun 1990 |
| Event | 1990 Conference on Precision Electromagnetic Measurements - Ottawa, Ont, Can Duration: Jun 11 1990 → Jun 14 1990 |
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