Probing large area surface plasmon interference in thin metal films using photon scanning tunneling microscopy

A. Passian; A. Wig; A. L. Lereu; P. G. Evans; F. Meriaudeau; T. Thundat; T. L. Ferrell

doi:10.1016/j.ultramic.2003.11.018

Probing large area surface plasmon interference in thin metal films using photon scanning tunneling microscopy

A. Passian
, A. Wig
, A. L. Lereu
, P. G. Evans
, F. Meriaudeau
, T. Thundat
, T. L. Ferrell

Department of Chemical and Biological Engineering

University at Buffalo

Research output: Contribution to journal › Article › peer-review

27 Scopus citations

Abstract

The interference of surface plasmons can provide important information regarding the surface features of the hosting thin metal film. We present an investigation of the interference of optically excited surface plasmons in the Kretschmann configuration in the visible spectrum. Large area surface plasmon interference regions are generated at several wavelengths and imaged with the photon scanning tunneling microscope. Furthermore, we discuss the non-retarded dispersion relations for the surface plasmons in the probe-metal system modeled as confocal hyperboloids of revolution in the spheroidal coordinate systems.

Original language	English
Pages (from-to)	429-436
Number of pages	8
Journal	Ultramicroscopy
Volume	100
Issue number	3-4
DOIs	https://doi.org/10.1016/j.ultramic.2003.11.018
State	Published - Aug 2004

Keywords

Dispersion relation
Interference
Metal thin films
Scanning probe microscopy
Surface plasmons

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10.1016/j.ultramic.2003.11.018

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title = "Probing large area surface plasmon interference in thin metal films using photon scanning tunneling microscopy",

abstract = "The interference of surface plasmons can provide important information regarding the surface features of the hosting thin metal film. We present an investigation of the interference of optically excited surface plasmons in the Kretschmann configuration in the visible spectrum. Large area surface plasmon interference regions are generated at several wavelengths and imaged with the photon scanning tunneling microscope. Furthermore, we discuss the non-retarded dispersion relations for the surface plasmons in the probe-metal system modeled as confocal hyperboloids of revolution in the spheroidal coordinate systems.",

keywords = "Dispersion relation, Interference, Metal thin films, Scanning probe microscopy, Surface plasmons",

author = "A. Passian and A. Wig and Lereu, \{A. L.\} and Evans, \{P. G.\} and F. Meriaudeau and T. Thundat and Ferrell, \{T. L.\}",

year = "2004",

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doi = "10.1016/j.ultramic.2003.11.018",

language = "English",

volume = "100",

pages = "429--436",

journal = "Ultramicroscopy",

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TY - JOUR

T1 - Probing large area surface plasmon interference in thin metal films using photon scanning tunneling microscopy

AU - Passian, A.

AU - Wig, A.

AU - Lereu, A. L.

AU - Evans, P. G.

AU - Meriaudeau, F.

AU - Thundat, T.

AU - Ferrell, T. L.

PY - 2004/8

Y1 - 2004/8

N2 - The interference of surface plasmons can provide important information regarding the surface features of the hosting thin metal film. We present an investigation of the interference of optically excited surface plasmons in the Kretschmann configuration in the visible spectrum. Large area surface plasmon interference regions are generated at several wavelengths and imaged with the photon scanning tunneling microscope. Furthermore, we discuss the non-retarded dispersion relations for the surface plasmons in the probe-metal system modeled as confocal hyperboloids of revolution in the spheroidal coordinate systems.

AB - The interference of surface plasmons can provide important information regarding the surface features of the hosting thin metal film. We present an investigation of the interference of optically excited surface plasmons in the Kretschmann configuration in the visible spectrum. Large area surface plasmon interference regions are generated at several wavelengths and imaged with the photon scanning tunneling microscope. Furthermore, we discuss the non-retarded dispersion relations for the surface plasmons in the probe-metal system modeled as confocal hyperboloids of revolution in the spheroidal coordinate systems.

KW - Dispersion relation

KW - Interference

KW - Metal thin films

KW - Scanning probe microscopy

KW - Surface plasmons

UR - https://www.scopus.com/pages/publications/3042652982

U2 - 10.1016/j.ultramic.2003.11.018

DO - 10.1016/j.ultramic.2003.11.018

M3 - Article

SN - 0304-3991

VL - 100

SP - 429

EP - 436

JO - Ultramicroscopy

JF - Ultramicroscopy

IS - 3-4

ER -

Probing large area surface plasmon interference in thin metal films using photon scanning tunneling microscopy

Abstract

Keywords

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