Abstract
Practical superconducting thick films and tapes, manufactured in an industrial process, have microscopic inhomogeneities. Quantitative magneto-optical imaging (MOI) is one of the most desirable techniques and provides both local and global information on defects, flux pinning, critical current density J c, and current distribution. We present, herein, a comparative magneto-optical imaging study of the flux profile in YBa 2Cu 3O 7-δ (YBCO) thick films prepared in two different processes, the laboratory versus the industrial scalable process. The remarkably different flux propagation patterns are the manifestation of their different defect landscapes within these films. A method of determining J c near zero applied field is also given for locally nonuniform superconducting films, using the quantitative MOI technique.
| Original language | English |
|---|---|
| Pages (from-to) | 1288-1292 |
| Number of pages | 5 |
| Journal | Journal of Electronic Materials |
| Volume | 36 |
| Issue number | 10 |
| DOIs | |
| State | Published - Oct 2007 |
Keywords
- Coated conductors
- Flux pinning
- J
- Magneto optical imaging (MOI)
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