Abstract
III–V quantum dot (QD) photodetectors enable on-chip sensing in the telecommunications O-band with high responsivity and low dark current. We demonstrate for the first time III–V QD photodetectors monolithically integrated with silicon nitride waveguides and III–V QD lasers. III–V QD material is heteroepitaxially grown in pockets on silicon photonics coupons, where it is coprocessed into III–V ridge waveguides serving as both photodetectors and lasers. The photodetectors have a dark current of 250 pA and a responsivity of 0.344 A/W at a –2 V bias. Photodetectors integrated with lasers in a loop configuration correctly measure threshold current and in-waveguide optical power at the few-mW level. This work demonstrates multifunctional III–V devices on the silicon photonics platform, enabling a wider variety of monolithically integrated active components without the need for additional process steps.
| Original language | English |
|---|---|
| Pages (from-to) | 5173-5178 |
| Number of pages | 6 |
| Journal | ACS Photonics |
| Volume | 12 |
| Issue number | 9 |
| DOIs | |
| State | Published - Sep 17 2025 |
Keywords
- monolithic integration
- pocket heteroepitaxy
- quantum dot laser
- quantum dot photodetector
- silicon photonics
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