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Quickest Detection of Series Arc Faults on DC Microgrids

  • SUNY Buffalo

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

10 Scopus citations

Abstract

In this paper we explore the problem of series arc fault detection and localization on dc microgrids. Through a statistical model of the microgrid obtained by nodal equation, the injection currents are modeled as a random vector whose distribution depends on the nodal voltages and the admittance matrix. A series arc fault causes a change in the admittance matrix, which further leads to a change in the data generating distribution of injection currents. The goal is to detect and localize faults on different lines in a timely fashion subject to false alarm constraints. The model is formulated as a quickest change detection problem, and the classical Cumulative Sum algorithm (CUSUM) is employed. The proposed framework is tested on a dc microgrid with active (constant power) loads. Furthermore, a case considering fault detection in the presence of an internal node is presented. Finally, we present an experimental result on a four node dc microgrid to verify the practical application of our approach.

Original languageEnglish
Title of host publication2021 IEEE Energy Conversion Congress and Exposition, ECCE 2021 - Proceedings
PublisherInstitute of Electrical and Electronics Engineers Inc.
Pages796-801
Number of pages6
ISBN (Electronic)9781728151359
DOIs
StatePublished - 2021
Event13th IEEE Energy Conversion Congress and Exposition, ECCE 2021 - Virtual, Online, Canada
Duration: Oct 10 2021Oct 14 2021

Publication series

Name2021 IEEE Energy Conversion Congress and Exposition, ECCE 2021 - Proceedings

Conference

Conference13th IEEE Energy Conversion Congress and Exposition, ECCE 2021
Country/TerritoryCanada
CityVirtual, Online
Period10/10/2110/14/21

Keywords

  • CUSUM
  • DC microgrid
  • Kron reduction
  • Quickest change detection
  • Series arc fault detection and localization

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