Abstract
The reduction of Cu2O islands grown on Cu(100) surfaces through vacuum annealing was analyzed by using ultrahigh vacuum transmission electron microscope. The reduction behavior of the surface oxide islands was described by a simple kinetic model based on the dissociation along the island perimeter. It was found that the complete reduction of the oxide islands lead to the formation of nanoindentations on the Cu surfaces. It was also found that the shrinkage of the surface oxide islands followed a linear decay behavior.
| Original language | English |
|---|---|
| Article number | 226101 |
| Journal | Physical Review Letters |
| Volume | 93 |
| Issue number | 22 |
| DOIs | |
| State | Published - Nov 29 2004 |
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