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Reliability testing of silicone-based thermal greases

  • Arun Gowda
  • , David Esler
  • , Sara N. Paisner
  • , Sandeep Tonapi
  • , Kaustubh Nagarkar
  • , K. Srihari

Research output: Contribution to journalConference articlepeer-review

45 Scopus citations

Abstract

Thermal Interface Materials (TIMs) play a key role in the thermal management of microelectronics by providing a path of low thermal impedance between the heat generating devices and the heat dissipating components (heat spreader/sink). Thermal greases are TIM solutions that are widely utilized in the industry for the cooling of microelectronics. Thermal greases are expected to provide a very low thermal resistance path due to their ability to penetrate into the surface features of heat spreaders/sinks and silicon die. In addition, thermal greases do not require post-processing. However, some of the disadvantages associated with thermal greases are their tendency to "dry-out" and "pump-out" during prolonged periods of operation [1]. These phenomena can drastically reduce the heat dissipation capability of the thermal grease layer. A "perfect" high thermal conductivity and low contact resistance TIM layer may become a voided and cracked layer on exposure to thermal and mechanical stresses. In this research, various tests are explored to determine the ability of thermal greases to deliver a reliable thermal interface, utilizing various thermal grease formulations, different TIM layer geometries, and testing conditions.

Original languageEnglish
Pages (from-to)64-71
Number of pages8
JournalAnnual IEEE Semiconductor Thermal Measurement and Management Symposium
StatePublished - 2005
Event21st Annual IEEE Semiconductor Thermal Measurement and Management Symposium - San Jose, CA, United States
Duration: Mar 15 2005Mar 17 2005

Keywords

  • Accelerated testing
  • Reliability
  • Thermal grease

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