Abstract
Thermal Interface Materials (TIMs) play a key role in the thermal management of microelectronics by providing a path of low thermal impedance between the heat generating devices and the heat dissipating components (heat spreader/sink). Thermal greases are TIM solutions that are widely utilized in the industry for the cooling of microelectronics. Thermal greases are expected to provide a very low thermal resistance path due to their ability to penetrate into the surface features of heat spreaders/sinks and silicon die. In addition, thermal greases do not require post-processing. However, some of the disadvantages associated with thermal greases are their tendency to "dry-out" and "pump-out" during prolonged periods of operation [1]. These phenomena can drastically reduce the heat dissipation capability of the thermal grease layer. A "perfect" high thermal conductivity and low contact resistance TIM layer may become a voided and cracked layer on exposure to thermal and mechanical stresses. In this research, various tests are explored to determine the ability of thermal greases to deliver a reliable thermal interface, utilizing various thermal grease formulations, different TIM layer geometries, and testing conditions.
| Original language | English |
|---|---|
| Pages (from-to) | 64-71 |
| Number of pages | 8 |
| Journal | Annual IEEE Semiconductor Thermal Measurement and Management Symposium |
| State | Published - 2005 |
| Event | 21st Annual IEEE Semiconductor Thermal Measurement and Management Symposium - San Jose, CA, United States Duration: Mar 15 2005 → Mar 17 2005 |
Keywords
- Accelerated testing
- Reliability
- Thermal grease
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