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Silicon carbide ultraviolet photodetector modeling, design and experiments

  • A. Akturk
  • , M. Dandin
  • , A. Vert
  • , S. Soloviev
  • , P. Sandvik
  • , S. Potbhare
  • , N. Goldsman
  • , P. Abshire

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

1 Scopus citations

Abstract

This paper features our early modeling results on the development a Silicon Carbide photodetector with enhanced short ultraviolet (UVC) wavelength responsivity. Design parameters that are of interest, other than improved UVC responsivity, are the breakdown voltage and the noise level, namely the dark count rate in Geiger mode. In order to optimize the above-mentioned parameter space, we focus on the precise engineering of the doping profile across the device, as well as that of the layer thicknesses, and in addition, we propose the design of an APD surface that gives rise to minimal recombination of photo-generated electron-hole pairs, a feature which ultimately improves the short-wavelength response. Our design is guided by a custom-written device simulator which uses pre-fabricated silicon carbide APDs for calibration.

Original languageEnglish
Title of host publicationSilicon Carbide and Related Materials 2011, ICSCRM 2011
EditorsRobert P. Devaty, Michael Dudley, T. Paul Chow, Philip G. Neudeck
PublisherTrans Tech Publications Ltd
Pages1199-1202
Number of pages4
ISBN (Print)9783037854198
DOIs
StatePublished - 2012
Event14th International Conference on Silicon Carbide and Related Materials 2011, ICSCRM 2011 - Cleveland, OH, United States
Duration: Sep 11 2011Sep 16 2011

Publication series

NameMaterials Science Forum
Volume717-720

Conference

Conference14th International Conference on Silicon Carbide and Related Materials 2011, ICSCRM 2011
Country/TerritoryUnited States
CityCleveland, OH
Period09/11/1109/16/11

Keywords

  • Avalanche photodiodes (APD)
  • Silicon carbide photodetectors
  • Ultraviolet detectors

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