Abstract
Polycapillary x-ray optics, arrays of hollow capillary tubes used to guide x-rays by total reflectance, are now being used in increasing numbers of applications, such as materials analysis, microelectronics manufacturing, x-ray astronomy and medical imaging. Because each optic contains hundreds of thousands of precisely shaped and located hollow channels, it is desirable to assess the feasibility of a variety of capillary geometries for a new application without physically constructing the optic. This assessment requires increasingly sophisticated modeling capability as new applications with more stringent requirements are developed. Previous analysis has shown that high-energy applications such as hard x-ray astronomy and medical imaging are particularly sensitive to optic profile errors such as channel waviness. A more physical model for surface waviness has been developed and included in optics simulations. The results are compared to measured data and to the results of other numerical simulation programs.
| Original language | English |
|---|---|
| Pages (from-to) | 643-651 |
| Number of pages | 9 |
| Journal | Proceedings of SPIE - The International Society for Optical Engineering |
| Volume | 3444 |
| DOIs | |
| State | Published - 1998 |
| Event | Proceedings of the 1998 Conference on X-Ray Optics, Instruments, and Missions - San Diego, CA, USA Duration: Jul 19 1998 → Jul 22 1998 |
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