Spatial resolution limits for x-ray microanalysis of bulk samples

Eric Lifshin; Raynald Gauvin; Kathleen Dunn; Di Wu; James Evertsen

doi:10.1017/s1431927603442682

Spatial resolution limits for x-ray microanalysis of bulk samples

Eric Lifshin
, Raynald Gauvin
, Kathleen Dunn
, Di Wu
, James Evertsen

Nanoscale Science and Engineering

University at Albany

SUNY Albany
McGill University

Research output: Contribution to journal › Article › peer-review

1 Scopus citations

Original language	English
Pages (from-to)	536-537
Number of pages	2
Journal	Microscopy and Microanalysis
Volume	9
Issue number	SUPPL. 2
DOIs	https://doi.org/10.1017/s1431927603442682
State	Published - 2003

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10.1017/s1431927603442682

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title = "Spatial resolution limits for x-ray microanalysis of bulk samples",

author = "Eric Lifshin and Raynald Gauvin and Kathleen Dunn and Di Wu and James Evertsen",

year = "2003",

doi = "10.1017/s1431927603442682",

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journal = "Microscopy and Microanalysis",

issn = "1431-9276",

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T1 - Spatial resolution limits for x-ray microanalysis of bulk samples

AU - Lifshin, Eric

AU - Gauvin, Raynald

AU - Dunn, Kathleen

AU - Wu, Di

AU - Evertsen, James

PY - 2003

Y1 - 2003

UR - https://www.scopus.com/pages/publications/0042924104

U2 - 10.1017/s1431927603442682

DO - 10.1017/s1431927603442682

M3 - Article

SN - 1431-9276

VL - 9

SP - 536

EP - 537

JO - Microscopy and Microanalysis

JF - Microscopy and Microanalysis

IS - SUPPL. 2

ER -

Spatial resolution limits for x-ray microanalysis of bulk samples

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