Abstract
An aluminogermanate analog of zeolite X has been synthesized by solution reaction, and characterized by Rietveld analysis of synchrotron powder X-ray diffraction data. The hydrated sample has a chemical formula Na96Al96Ge96O384·wH 2O, and the material possesses an ordered arrangement of Al and Ge in the framework. A cell parameter of 25.589(1)Å confirms the expected cell expansion over Low Silica X (LSX), although a smaller average framework T-O-T bond angle indicates greater relative cell collapse than for LSX. The distribution of sodium cations in the non-framework sites in NaGeX is significantly different from that in LSX, and appears to deviate from the proposed relationship between Al content and cation siting for hydrated aluminosilicate faujasite-type zeolites.
| Original language | English |
|---|---|
| Pages (from-to) | 195-204 |
| Number of pages | 10 |
| Journal | Microporous and Mesoporous Materials |
| Volume | 31 |
| Issue number | 1-2 |
| DOIs | |
| State | Published - Oct 1999 |
Keywords
- Germanium
- Rietveld analysis
- Synchrotron
- X-ray diffraction
- X-type zeolite
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