Substrate dependence of morphology in thin film polymer blends of polystyrene and poly(methyl methacrylate)

D. A. Winesett; H. Ade; J. Sokolov; M. Rafailovich; S. Zhu

doi:10.1002/(SICI)1097-0126(200005)49:5

Substrate dependence of morphology in thin film polymer blends of polystyrene and poly(methyl methacrylate)

D. A. Winesett
, H. Ade
, J. Sokolov
, M. Rafailovich
, S. Zhu

Materials Science and Engineering

Stony Brook University

North Carolina State University
Stony Brook University

Research output: Contribution to journal › Article › peer-review

52 Scopus citations

Abstract

We studied the effects of different substrates on the development of the morphologies in thin film polymer blends in as-spun and annealed films. We have utilized thin films of blends of polystyrene and poly(methyl methacrylate) spun cast on Si, Au and Co surfaces, and produced quantitative composition maps with near edge X-ray absorption fine structure (NEXAFS) microscopy as a function of annealing time. We observed a marked dependence of the morphologies and the qualitative dynamics on the surface composition.

Original language	English
Pages (from-to)	458-462
Number of pages	5
Journal	Polymer International
Volume	49
Issue number	5
DOIs	https://doi.org/10.1002/(SICI)1097-0126(200005)49:5
State	Published - 2000

Keywords

Blends
Homopolymer
NEXAFS microscopy
PMMA
PS
Phase segregation
Surface
Thin film

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10.1002/(SICI)1097-0126(200005)49:5

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title = "Substrate dependence of morphology in thin film polymer blends of polystyrene and poly(methyl methacrylate)",

abstract = "We studied the effects of different substrates on the development of the morphologies in thin film polymer blends in as-spun and annealed films. We have utilized thin films of blends of polystyrene and poly(methyl methacrylate) spun cast on Si, Au and Co surfaces, and produced quantitative composition maps with near edge X-ray absorption fine structure (NEXAFS) microscopy as a function of annealing time. We observed a marked dependence of the morphologies and the qualitative dynamics on the surface composition.",

keywords = "Blends, Homopolymer, NEXAFS microscopy, PMMA, PS, Phase segregation, Surface, Thin film",

author = "Winesett, \{D. A.\} and H. Ade and J. Sokolov and M. Rafailovich and S. Zhu",

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T1 - Substrate dependence of morphology in thin film polymer blends of polystyrene and poly(methyl methacrylate)

AU - Winesett, D. A.

AU - Ade, H.

AU - Sokolov, J.

AU - Rafailovich, M.

AU - Zhu, S.

PY - 2000

Y1 - 2000

N2 - We studied the effects of different substrates on the development of the morphologies in thin film polymer blends in as-spun and annealed films. We have utilized thin films of blends of polystyrene and poly(methyl methacrylate) spun cast on Si, Au and Co surfaces, and produced quantitative composition maps with near edge X-ray absorption fine structure (NEXAFS) microscopy as a function of annealing time. We observed a marked dependence of the morphologies and the qualitative dynamics on the surface composition.

AB - We studied the effects of different substrates on the development of the morphologies in thin film polymer blends in as-spun and annealed films. We have utilized thin films of blends of polystyrene and poly(methyl methacrylate) spun cast on Si, Au and Co surfaces, and produced quantitative composition maps with near edge X-ray absorption fine structure (NEXAFS) microscopy as a function of annealing time. We observed a marked dependence of the morphologies and the qualitative dynamics on the surface composition.

KW - Blends

KW - Homopolymer

KW - NEXAFS microscopy

KW - PMMA

KW - PS

KW - Phase segregation

KW - Surface

KW - Thin film

UR - https://www.scopus.com/pages/publications/0034187367

U2 - 10.1002/(SICI)1097-0126(200005)49:5

DO - 10.1002/(SICI)1097-0126(200005)49:5

M3 - Article

SN - 0959-8103

VL - 49

SP - 458

EP - 462

JO - Polymer International

JF - Polymer International

IS - 5

ER -

Substrate dependence of morphology in thin film polymer blends of polystyrene and poly(methyl methacrylate)

Abstract

Keywords

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