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Synchrotron x-ray scattering studies of the surface structure and dynamics of liquids and liquid films

  • Hyunjung Kim
  • , Zhang Jiang
  • , Heeju Lee
  • , Young Joo Lee
  • , Xuesong Jiao
  • , Chunhua Li
  • , Laurence Lurio
  • , Xuesong Hu
  • , Jyotsana Lal
  • , Miriam Rafailovich
  • , S. K. Sinha
  • Sogang University
  • University of California at San Diego
  • Northern Illinois University
  • Stony Brook University
  • Argonne National Laboratory
  • United States Department of Energy

Research output: Contribution to journalConference articlepeer-review

Abstract

The dynamics of surface fluctuations in thin supported polystyrene films have been investigated using x-ray photon correlation spectroscopy (XPCS) in reflection geometry. The results from the films thicker than four times of the radius of gyration (Rg) of polystyrene show the behavior of the capillary waves expected in viscous liquid. However, thinner films show a deviation indicating the need to account for viscoelasticity. Theoretical considerations with viscoelastic liquid model has been performed by introducing frequency dependent viscosity and compared with Fredrickson's brush model (Macromolecules, 25, 2882 (1992)). The theory has been extended to the surface and interfacial modes in a bilayer film system, The results will be discussed in terms of surface tension, viscosity, and shear modulus.

Original languageEnglish
Pages (from-to)179-187
Number of pages9
JournalMaterials Research Society Symposium - Proceedings
Volume899
DOIs
StatePublished - 2005
Event2005 MRS Fall Meeting - Boston, MA, United States
Duration: Nov 28 2005Dec 2 2005

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