Synchrotron X-ray topography study of structural defects and strain in epitaxial structures of Yb- and Tm-doped potassium rare-earth double tungstates and their influence on Laser Performance

B. Raghothamachar; J. J. Carvajal; M. C. Pujol; X. Mateos; R. Solé; M. Aguiló; F. Díaz; M. Dudley

doi:10.1007/s11664-010-1226-0

Synchrotron X-ray topography study of structural defects and strain in epitaxial structures of Yb- and Tm-doped potassium rare-earth double tungstates and their influence on Laser Performance

B. Raghothamachar
, J. J. Carvajal
, M. C. Pujol
, X. Mateos
, R. Solé
, M. Aguiló
, F. Díaz
, M. Dudley

Materials Science and Engineering

Stony Brook University

Research output: Contribution to journal › Article › peer-review

Abstract

Monoclinic potassium rare-earth double tungstates [KRE(WO ₄) ₂, RE = Y, Lu, Yb; KREW] are well suited as hosts for active lanthanide ion (Ln ³⁺) dopants for diode-pumped solid-state lasers, with particular interest in thin-disk laser configurations when they are grown as thin films. Using synchrotron white- beam x-ray topography, we have imaged defects and strain in top-seeded solution-grown (TSSG) bulk substrates of different rare-earth tungstates as well as within Yb ³⁺- and Tm ³⁺-doped epitaxies for thin-disk laser applications grown on these substrates by liquid-phase epitaxy. Higher structural stress in Yb:KYW/KYW epitaxies compared with Yb:KLuW/KLuW epitaxies is found to lower efficiency in laser operation. The quality of Tm:KLuW/KLuW epitaxial films is sensitive to doping level, film thickness, and growth rate. Inhomogeneous stresses within the layers are dominated by lattice-mismatch effects rather than by crystallographic anisotropy.

Original language	English
Pages (from-to)	823-829
Number of pages	7
Journal	Journal of Electronic Materials
Volume	39
Issue number	6
DOIs	https://doi.org/10.1007/s11664-010-1226-0
State	Published - Jun 2010

Keywords

Crystal growth
Defects
Liquid-phase epitaxy
Monoclinic double tungstates
Strain
Thin-disk lasers
Top-seeded solution growth
X-ray topography

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10.1007/s11664-010-1226-0

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Raghothamachar, B., Carvajal, J. J., Pujol, M. C., Mateos, X., Solé, R., Aguiló, M., Díaz, F., & Dudley, M. (2010). Synchrotron X-ray topography study of structural defects and strain in epitaxial structures of Yb- and Tm-doped potassium rare-earth double tungstates and their influence on Laser Performance. Journal of Electronic Materials, 39(6), 823-829. https://doi.org/10.1007/s11664-010-1226-0

@article{e274e171bbb74cdcab3bc4fa5205be7d,

title = "Synchrotron X-ray topography study of structural defects and strain in epitaxial structures of Yb- and Tm-doped potassium rare-earth double tungstates and their influence on Laser Performance",

abstract = "Monoclinic potassium rare-earth double tungstates [KRE(WO 4) 2, RE = Y, Lu, Yb; KREW] are well suited as hosts for active lanthanide ion (Ln 3+) dopants for diode-pumped solid-state lasers, with particular interest in thin-disk laser configurations when they are grown as thin films. Using synchrotron white- beam x-ray topography, we have imaged defects and strain in top-seeded solution-grown (TSSG) bulk substrates of different rare-earth tungstates as well as within Yb 3+- and Tm 3+-doped epitaxies for thin-disk laser applications grown on these substrates by liquid-phase epitaxy. Higher structural stress in Yb:KYW/KYW epitaxies compared with Yb:KLuW/KLuW epitaxies is found to lower efficiency in laser operation. The quality of Tm:KLuW/KLuW epitaxial films is sensitive to doping level, film thickness, and growth rate. Inhomogeneous stresses within the layers are dominated by lattice-mismatch effects rather than by crystallographic anisotropy.",

keywords = "Crystal growth, Defects, Liquid-phase epitaxy, Monoclinic double tungstates, Strain, Thin-disk lasers, Top-seeded solution growth, X-ray topography",

author = "B. Raghothamachar and Carvajal, \{J. J.\} and Pujol, \{M. C.\} and X. Mateos and R. Sol{\'e} and M. Aguil{\'o} and F. D{\'i}az and M. Dudley",

year = "2010",

month = jun,

doi = "10.1007/s11664-010-1226-0",

language = "English",

volume = "39",

pages = "823--829",

journal = "Journal of Electronic Materials",

issn = "0361-5235",

publisher = "Springer New York",

number = "6",

}

Raghothamachar, B, Carvajal, JJ, Pujol, MC, Mateos, X, Solé, R, Aguiló, M, Díaz, F & Dudley, M 2010, 'Synchrotron X-ray topography study of structural defects and strain in epitaxial structures of Yb- and Tm-doped potassium rare-earth double tungstates and their influence on Laser Performance', Journal of Electronic Materials, vol. 39, no. 6, pp. 823-829. https://doi.org/10.1007/s11664-010-1226-0

Synchrotron X-ray topography study of structural defects and strain in epitaxial structures of Yb- and Tm-doped potassium rare-earth double tungstates and their influence on Laser Performance. / Raghothamachar, B.; Carvajal, J. J.; Pujol, M. C. et al.
In: Journal of Electronic Materials, Vol. 39, No. 6, 06.2010, p. 823-829.

Research output: Contribution to journal › Article › peer-review

TY - JOUR

T1 - Synchrotron X-ray topography study of structural defects and strain in epitaxial structures of Yb- and Tm-doped potassium rare-earth double tungstates and their influence on Laser Performance

AU - Raghothamachar, B.

AU - Carvajal, J. J.

AU - Pujol, M. C.

AU - Mateos, X.

AU - Solé, R.

AU - Aguiló, M.

AU - Díaz, F.

AU - Dudley, M.

PY - 2010/6

Y1 - 2010/6

N2 - Monoclinic potassium rare-earth double tungstates [KRE(WO 4) 2, RE = Y, Lu, Yb; KREW] are well suited as hosts for active lanthanide ion (Ln 3+) dopants for diode-pumped solid-state lasers, with particular interest in thin-disk laser configurations when they are grown as thin films. Using synchrotron white- beam x-ray topography, we have imaged defects and strain in top-seeded solution-grown (TSSG) bulk substrates of different rare-earth tungstates as well as within Yb 3+- and Tm 3+-doped epitaxies for thin-disk laser applications grown on these substrates by liquid-phase epitaxy. Higher structural stress in Yb:KYW/KYW epitaxies compared with Yb:KLuW/KLuW epitaxies is found to lower efficiency in laser operation. The quality of Tm:KLuW/KLuW epitaxial films is sensitive to doping level, film thickness, and growth rate. Inhomogeneous stresses within the layers are dominated by lattice-mismatch effects rather than by crystallographic anisotropy.

AB - Monoclinic potassium rare-earth double tungstates [KRE(WO 4) 2, RE = Y, Lu, Yb; KREW] are well suited as hosts for active lanthanide ion (Ln 3+) dopants for diode-pumped solid-state lasers, with particular interest in thin-disk laser configurations when they are grown as thin films. Using synchrotron white- beam x-ray topography, we have imaged defects and strain in top-seeded solution-grown (TSSG) bulk substrates of different rare-earth tungstates as well as within Yb 3+- and Tm 3+-doped epitaxies for thin-disk laser applications grown on these substrates by liquid-phase epitaxy. Higher structural stress in Yb:KYW/KYW epitaxies compared with Yb:KLuW/KLuW epitaxies is found to lower efficiency in laser operation. The quality of Tm:KLuW/KLuW epitaxial films is sensitive to doping level, film thickness, and growth rate. Inhomogeneous stresses within the layers are dominated by lattice-mismatch effects rather than by crystallographic anisotropy.

KW - Crystal growth

KW - Defects

KW - Liquid-phase epitaxy

KW - Monoclinic double tungstates

KW - Strain

KW - Thin-disk lasers

KW - Top-seeded solution growth

KW - X-ray topography

UR - https://www.scopus.com/pages/publications/77954624531

U2 - 10.1007/s11664-010-1226-0

DO - 10.1007/s11664-010-1226-0

M3 - Article

SN - 0361-5235

VL - 39

SP - 823

EP - 829

JO - Journal of Electronic Materials

JF - Journal of Electronic Materials

IS - 6

ER -

Synchrotron X-ray topography study of structural defects and strain in epitaxial structures of Yb- and Tm-doped potassium rare-earth double tungstates and their influence on Laser Performance

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Keywords

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