Abstract
Integrating magnetic functionalities with silicon holds the promise of developing, in the most dominant semiconductor, a paradigm-shift information technology based on the manipulation and control of electron spin and charge. Here, we demonstrate an ion implantation approach enabling the synthesis of a ferromagnetic layer within a defect free Si environment by exploiting an additional implant of hydrogen in a region deep below the metal implanted layer. Upon post-implantation annealing, nanocavities created within the H-implanted region act as trapping sites for gettering the implanted metal species, resulting in the formation of metal nanoparticles in a Si region of excellent crystal quality. This is exemplified by the synthesis of magnetic nickel nanoparticles in Si implanted with H+ (range: ∼850nm; dose: 1.5×1016cm-2) and Ni+ (range: ∼60nm; dose: 2×1015cm-2). Following annealing, the H implanted regions populated with Ni nanoparticles of size (∼10-25nm) and density (∼1011/cm2) typical of those achievable via conventional thin film deposition and growth techniques. In particular, a maximum amount of gettered Ni atoms occurs after annealing at 900°C, yielding strong ferromagnetism persisting even at room temperature, as well as fully recovered crystalline Si environments adjacent to these Ni nanoparticles. Furthermore, Ni nanoparticles capsulated within a high-quality crystalline Si layer exhibit a very high magnetic switching energy barrier of ∼0.86eV, an increase by about one order of magnitude as compared to their counterparts on a Si surface or in a highly defective Si environment.
| Original language | English |
|---|---|
| Article number | 054306 |
| Journal | Journal of Applied Physics |
| Volume | 116 |
| Issue number | 5 |
| DOIs | |
| State | Published - Aug 7 2014 |
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