Technical Trials and Legal Tribulations

Scott Craver; Boon Lock Yeo; Minerva M. Yeung

doi:10.1145/278476.278486

Technical Trials and Legal Tribulations

Scott Craver
, Boon Lock Yeo
, Minerva M. Yeung

Electrical and Computer Eng

Binghamton University

Intel

Research output: Contribution to journal › Article › peer-review

58 Scopus citations

Original language	English
Pages (from-to)	45-54
Number of pages	10
Journal	Communications of the ACM
Volume	41
Issue number	7
DOIs	https://doi.org/10.1145/278476.278486
State	Published - Jul 1 1998

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title = "Technical Trials and Legal Tribulations",

author = "Scott Craver and Yeo, \{Boon Lock\} and Yeung, \{Minerva M.\}",

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journal = "Communications of the ACM",

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AU - Craver, Scott

AU - Yeo, Boon Lock

AU - Yeung, Minerva M.

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JO - Communications of the ACM

JF - Communications of the ACM

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Technical Trials and Legal Tribulations

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