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Temperature dependence of the electrical performance of SrBi2Ta2O9 for non-volatile memory applications

  • D. J. Taylor
  • , R. E. Jones
  • , P. Y. Chu
  • , P. Zurcher
  • , B. White
  • , S. Zafar
  • , S. J. Gillespie

Research output: Contribution to conferencePaperpeer-review

2 Scopus citations

Abstract

Studies of the temperature dependence of many of the important electrical properties of SBT are presented. These include: (a) the remanent polarization (2Pr), the non-volatile polarization (Pnv), and the coercive field (Ec) all of which are studied as functions of the pulse amplitude; (b) fatigue resistance of 2Pr and Pnv; (c) the retention; and (d) the current versus voltage behavior. These studies demonstrate that SBT looks very promising for ferroelectric non-volatile memories over the consumer application range (0 to 70 °C).

Original languageEnglish
Pages55-58
Number of pages4
StatePublished - 1996
EventProceedings of the 1996 10th IEEE International Symposium on Applications of Ferroelectrics, ISAF. Part 1 (of 2) - East Brunswick, NJ, USA
Duration: Aug 18 1996Aug 21 1996

Conference

ConferenceProceedings of the 1996 10th IEEE International Symposium on Applications of Ferroelectrics, ISAF. Part 1 (of 2)
CityEast Brunswick, NJ, USA
Period08/18/9608/21/96

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