Abstract
We investigate the measurement of a thin sample's optical thickness using the transport of intensity equation (TIE) and demonstrate a version of the TIE, valid for partially coherent illumination, that allows the measurement of a sample's optical path length by the removal of illumination effects.
| Original language | English |
|---|---|
| Pages (from-to) | 14430-14441 |
| Number of pages | 12 |
| Journal | Optics Express |
| Volume | 21 |
| Issue number | 12 |
| DOIs | |
| State | Published - Jun 2013 |
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