The use of ion beam techniques to characterize lead diffusion in minerals

D. J. Cherniak; W. A. Lanford; F. J. Ryerson

doi:10.1016/0168-583X(90)90824-E

The use of ion beam techniques to characterize lead diffusion in minerals

D. J. Cherniak
, W. A. Lanford
, F. J. Ryerson

University at Albany Research Foundation

University at Albany

SUNY Albany
Lawrence Livermore National Laboratory

Research output: Contribution to journal › Article › peer-review

10 Scopus citations

Abstract

Ion implantation is used to introduce lead into the mineral apatite. Diffusion profiles are obtained using Rutherford backscattering (RBS) and the results fit with a model to determine D. Results for apatite over the temperature range 600-900 ° C show agreement with earlier results obtained by traditional geological techniques. This suggests that radiation damage induced by ion implantation has little effect on diffusion in this case. This approach is both simple and useful in studying diffusion over a temperature range of geologic interest without inordinate annealing times.

Original language	English
Pages (from-to)	230-233
Number of pages	4
Journal	Nuclear Inst. and Methods in Physics Research, B
Volume	45
Issue number	1-4
DOIs	https://doi.org/10.1016/0168-583X(90)90824-E
State	Published - Jan 2 1990

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@article{9f0d4266a58e494b8f0ccb3186524c9f,

title = "The use of ion beam techniques to characterize lead diffusion in minerals",

abstract = "Ion implantation is used to introduce lead into the mineral apatite. Diffusion profiles are obtained using Rutherford backscattering (RBS) and the results fit with a model to determine D. Results for apatite over the temperature range 600-900 ° C show agreement with earlier results obtained by traditional geological techniques. This suggests that radiation damage induced by ion implantation has little effect on diffusion in this case. This approach is both simple and useful in studying diffusion over a temperature range of geologic interest without inordinate annealing times.",

author = "Cherniak, \{D. J.\} and Lanford, \{W. A.\} and Ryerson, \{F. J.\}",

year = "1990",

month = jan,

day = "2",

doi = "10.1016/0168-583X(90)90824-E",

language = "English",

volume = "45",

pages = "230--233",

journal = "Nuclear Inst. and Methods in Physics Research, B",

issn = "0168-583X",

number = "1-4",

}

TY - JOUR

T1 - The use of ion beam techniques to characterize lead diffusion in minerals

AU - Cherniak, D. J.

AU - Lanford, W. A.

AU - Ryerson, F. J.

PY - 1990/1/2

Y1 - 1990/1/2

N2 - Ion implantation is used to introduce lead into the mineral apatite. Diffusion profiles are obtained using Rutherford backscattering (RBS) and the results fit with a model to determine D. Results for apatite over the temperature range 600-900 ° C show agreement with earlier results obtained by traditional geological techniques. This suggests that radiation damage induced by ion implantation has little effect on diffusion in this case. This approach is both simple and useful in studying diffusion over a temperature range of geologic interest without inordinate annealing times.

AB - Ion implantation is used to introduce lead into the mineral apatite. Diffusion profiles are obtained using Rutherford backscattering (RBS) and the results fit with a model to determine D. Results for apatite over the temperature range 600-900 ° C show agreement with earlier results obtained by traditional geological techniques. This suggests that radiation damage induced by ion implantation has little effect on diffusion in this case. This approach is both simple and useful in studying diffusion over a temperature range of geologic interest without inordinate annealing times.

UR - https://www.scopus.com/pages/publications/0025206788

U2 - 10.1016/0168-583X(90)90824-E

DO - 10.1016/0168-583X(90)90824-E

M3 - Article

SN - 0168-583X

VL - 45

SP - 230

EP - 233

JO - Nuclear Inst. and Methods in Physics Research, B

JF - Nuclear Inst. and Methods in Physics Research, B

IS - 1-4

ER -

The use of ion beam techniques to characterize lead diffusion in minerals

Abstract

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