TY - GEN
T1 - Wavelet Shrinkage for Enhanced Chemical Recognition in the Rough Surface Diffused Terahertz Spectra
AU - Khani, Mahmoud E.
AU - Arbab, M. Hassan
N1 - Publisher Copyright: © 2020 IEEE.
PY - 2020/11/8
Y1 - 2020/11/8
N2 - The rough surface scattering in the reflection-mode THz-TDS can result in inaccurate phase spectra, reduced signal to noise ratios, distorted or obscured resonant fingerprints, and the appearance of anomalous spectral artifacts. In this work, we demonstrate the implementation of a wavelet shrinkage technique for the retrieval of obscured resonant frequencies from the derivative of THz reflectivity of solid dielectric materials. We examine the robustness of this technique over controlled levels of rough surface scattering created using sandpapers of different grits on sample disks made from 4-aminobenzoic acid (PABA).
AB - The rough surface scattering in the reflection-mode THz-TDS can result in inaccurate phase spectra, reduced signal to noise ratios, distorted or obscured resonant fingerprints, and the appearance of anomalous spectral artifacts. In this work, we demonstrate the implementation of a wavelet shrinkage technique for the retrieval of obscured resonant frequencies from the derivative of THz reflectivity of solid dielectric materials. We examine the robustness of this technique over controlled levels of rough surface scattering created using sandpapers of different grits on sample disks made from 4-aminobenzoic acid (PABA).
UR - https://www.scopus.com/pages/publications/85103219206
U2 - 10.1109/IRMMW-THz46771.2020.9370518
DO - 10.1109/IRMMW-THz46771.2020.9370518
M3 - Conference contribution
T3 - International Conference on Infrared, Millimeter, and Terahertz Waves, IRMMW-THz
SP - 752
EP - 753
BT - 2020 45th International Conference on Infrared, Millimeter, and Terahertz Waves, IRMMW-THz 2020
PB - IEEE Computer Society
T2 - 45th International Conference on Infrared, Millimeter, and Terahertz Waves, IRMMW-THz 2020
Y2 - 8 November 2020 through 13 November 2020
ER -