X-ray diffuse scattering study of static undulations in multilayer films of a liquid-crystalline polymer

R. E. Geer; R. Shashidhar; A. F. Thibodeaux; R. S. Duran

doi:10.1103/PhysRevLett.71.1391

X-ray diffuse scattering study of static undulations in multilayer films of a liquid-crystalline polymer

R. E. Geer
, R. Shashidhar
, A. F. Thibodeaux
, R. S. Duran

Nanoscale Science and Engineering

University at Albany

Naval Research Laboratory
University of Florida

Research output: Contribution to journal › Article › peer-review

42 Scopus citations

Abstract

The first detailed x-ray study of static undulations in a liquid-crystal polymer is presented. By examining the nonspecular diffuse scattering from a 30-layer ferroelectric liquid-crystal polymer film, it is shown that the layer fluctuations are induced by the roughness of the film-substrate interface. This contrasts with the case of free-standing films wherein .thermal fluctuations play the major role.

Original language	English
Pages (from-to)	1391-1394
Number of pages	4
Journal	Physical Review Letters
Volume	71
Issue number	9
DOIs	https://doi.org/10.1103/PhysRevLett.71.1391
State	Published - 1993

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title = "X-ray diffuse scattering study of static undulations in multilayer films of a liquid-crystalline polymer",

abstract = "The first detailed x-ray study of static undulations in a liquid-crystal polymer is presented. By examining the nonspecular diffuse scattering from a 30-layer ferroelectric liquid-crystal polymer film, it is shown that the layer fluctuations are induced by the roughness of the film-substrate interface. This contrasts with the case of free-standing films wherein .thermal fluctuations play the major role.",

author = "Geer, \{R. E.\} and R. Shashidhar and Thibodeaux, \{A. F.\} and Duran, \{R. S.\}",

year = "1993",

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AU - Geer, R. E.

AU - Shashidhar, R.

AU - Thibodeaux, A. F.

AU - Duran, R. S.

PY - 1993

Y1 - 1993

N2 - The first detailed x-ray study of static undulations in a liquid-crystal polymer is presented. By examining the nonspecular diffuse scattering from a 30-layer ferroelectric liquid-crystal polymer film, it is shown that the layer fluctuations are induced by the roughness of the film-substrate interface. This contrasts with the case of free-standing films wherein .thermal fluctuations play the major role.

AB - The first detailed x-ray study of static undulations in a liquid-crystal polymer is presented. By examining the nonspecular diffuse scattering from a 30-layer ferroelectric liquid-crystal polymer film, it is shown that the layer fluctuations are induced by the roughness of the film-substrate interface. This contrasts with the case of free-standing films wherein .thermal fluctuations play the major role.

UR - https://www.scopus.com/pages/publications/0000949909

U2 - 10.1103/PhysRevLett.71.1391

DO - 10.1103/PhysRevLett.71.1391

M3 - Article

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VL - 71

SP - 1391

EP - 1394

JO - Physical Review Letters

JF - Physical Review Letters

IS - 9

ER -

X-ray diffuse scattering study of static undulations in multilayer films of a liquid-crystalline polymer

Abstract

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