X-ray magnetic microscopy for correlations between magnetic domains and crystal structure

G. Denbeaux; E. Anderson; B. Bates; W. Chao; J. A. Liddle; B. Harteneck; A. Pearson; F. Salmassi; G. Schneider; P. Fischer; T. Eimüller; S. Taylor; H. Chang; G. J. Kusinski

doi:10.1051/jp4:20030126

X-ray magnetic microscopy for correlations between magnetic domains and crystal structure

G. Denbeaux
, E. Anderson
, B. Bates
, W. Chao
, J. A. Liddle
, B. Harteneck
, A. Pearson
, F. Salmassi
, G. Schneider
, P. Fischer
, T. Eimüller
, S. Taylor
, H. Chang
, G. J. Kusinski

Nanoscale Science and Engineering

University at Albany

Lawrence Berkeley National Laboratory
Max Planck Institute for Intelligent Systems
MMFX Technologies

Research output: Contribution to journal › Conference article › peer-review

2 Scopus citations

Abstract

Accurately determining the resolution of x-ray microscopes has been a challenge because good test patterns for x-ray microscopy have been hard to make. We report on a sputter-deposited multilayer imaged in cross section as a test pattern with small features and high aspect ratios. One application of high-resolution imaging is magnetic materials. Off-axis bend magnet radiation is known to have a component of circular polarization which can be used for x-ray magnetic circular dichroism. We calculate the integrated circular polarization collected by the illumination optics in the XM-1 full-field x-ray microscope.

Original language	English
Pages (from-to)	477-481
Number of pages	5
Journal	Journal De Physique. IV : JP
Volume	104
DOIs	https://doi.org/10.1051/jp4:20030126
State	Published - Mar 2003
Event	7th International Conference on X-Ray Microscopy - Grenoble, France Duration: Jul 28 2002 → Aug 2 2002

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title = "X-ray magnetic microscopy for correlations between magnetic domains and crystal structure",

abstract = "Accurately determining the resolution of x-ray microscopes has been a challenge because good test patterns for x-ray microscopy have been hard to make. We report on a sputter-deposited multilayer imaged in cross section as a test pattern with small features and high aspect ratios. One application of high-resolution imaging is magnetic materials. Off-axis bend magnet radiation is known to have a component of circular polarization which can be used for x-ray magnetic circular dichroism. We calculate the integrated circular polarization collected by the illumination optics in the XM-1 full-field x-ray microscope.",

author = "G. Denbeaux and E. Anderson and B. Bates and W. Chao and Liddle, \{J. A.\} and B. Harteneck and A. Pearson and F. Salmassi and G. Schneider and P. Fischer and T. Eim{\"u}ller and S. Taylor and H. Chang and Kusinski, \{G. J.\}",

year = "2003",

month = mar,

doi = "10.1051/jp4:20030126",

language = "English",

volume = "104",

pages = "477--481",

journal = "Journal De Physique. IV : JP",

issn = "1155-4339",

publisher = "Springer Verlag",

note = "7th International Conference on X-Ray Microscopy ; Conference date: 28-07-2002 Through 02-08-2002",

}

TY - JOUR

T1 - X-ray magnetic microscopy for correlations between magnetic domains and crystal structure

AU - Denbeaux, G.

AU - Anderson, E.

AU - Bates, B.

AU - Chao, W.

AU - Liddle, J. A.

AU - Harteneck, B.

AU - Pearson, A.

AU - Salmassi, F.

AU - Schneider, G.

AU - Fischer, P.

AU - Eimüller, T.

AU - Taylor, S.

AU - Chang, H.

AU - Kusinski, G. J.

PY - 2003/3

Y1 - 2003/3

N2 - Accurately determining the resolution of x-ray microscopes has been a challenge because good test patterns for x-ray microscopy have been hard to make. We report on a sputter-deposited multilayer imaged in cross section as a test pattern with small features and high aspect ratios. One application of high-resolution imaging is magnetic materials. Off-axis bend magnet radiation is known to have a component of circular polarization which can be used for x-ray magnetic circular dichroism. We calculate the integrated circular polarization collected by the illumination optics in the XM-1 full-field x-ray microscope.

AB - Accurately determining the resolution of x-ray microscopes has been a challenge because good test patterns for x-ray microscopy have been hard to make. We report on a sputter-deposited multilayer imaged in cross section as a test pattern with small features and high aspect ratios. One application of high-resolution imaging is magnetic materials. Off-axis bend magnet radiation is known to have a component of circular polarization which can be used for x-ray magnetic circular dichroism. We calculate the integrated circular polarization collected by the illumination optics in the XM-1 full-field x-ray microscope.

UR - https://www.scopus.com/pages/publications/0038363815

U2 - 10.1051/jp4:20030126

DO - 10.1051/jp4:20030126

M3 - Conference article

SN - 1155-4339

VL - 104

SP - 477

EP - 481

JO - Journal De Physique. IV : JP

JF - Journal De Physique. IV : JP

T2 - 7th International Conference on X-Ray Microscopy

Y2 - 28 July 2002 through 2 August 2002

ER -

X-ray magnetic microscopy for correlations between magnetic domains and crystal structure

Abstract

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