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X-ray Scattering

Research output: Chapter in Book/Report/Conference proceedingChapterpeer-review

4 Scopus citations

Abstract

Structure characterization in Fourier space uses X-ray, neutron, or light scattering to analyze structural correlations on a molecular or supramolecular length scale. Unlike microscopy, the probed sample volume for scattering techniques is macroscopically large, and the generated structural information is not a direct image of the structure. Using adequate data analysis, Fourier space characterization can provide quantitative information both on structural units (e.g., unit cells, discrete particles) and on their mutual arrangement (ordered, disordered, preferentially oriented). Experimental scattering techniques do not destroy the sample and can be carried out in situ.

Original languageEnglish
Title of host publicationPolymer Science
Subtitle of host publicationA Comprehensive Reference, 10 Volume Set
PublisherElsevier
Pages363-380
Number of pages18
Volume2
ISBN (Print)9780080878621
DOIs
StatePublished - 2012

Keywords

  • Autocorrelation functions
  • Crystallinity
  • Fiber scattering
  • Lattice disorder
  • Layered structures
  • Macrolattices
  • Nanostructures
  • Porod's law
  • Preferred orientation
  • SAXS
  • Semicrystalline polymers
  • Solution scattering
  • Two-phase systems
  • WAXS
  • X-ray scattering

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